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In this paper, constant-stress Accelerated Life Testing (ALT) is studied when the lifetime of test units follows Power Generalized Weibull (PGW) distribution. The Maximum Likelihood Estimates (MLEs) and Bayes Estimates (BEs) of the model parameters are obtained under type-II progressive censoring. Moreover, the approximate and credible Confidence Intervals (CIs) of the parameters are derived. The optimal stress level is discussed under D-optimality criterion. Furthermore, a real dataset is analyzed to show the suggested methods. Moreover, this real dataset is used to show the role of PGW distribution as an alternative to the other well-known distributions. Finally, simulation studies are conducted to demonstrate the precision of the MLEs and BEs for the parameters of PGW distribution.

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