The present article, studied about the Bayes risks of the unknown parameters of the generalized Inverted Exponential distribution. The Optimum Step-Stress Partially Accelerated Life Test (SS-PALT) has been used under the different censoring patterns. A comparison between Bayes risks of two different asymmetric loss functions has presented. Numerical illustration has also been carried out by the help of the real and simulated data set.
Digital Object Identifier (DOI)
"Generalized Inverted Exponential Distribution on Optimum SS-PALT: Some Bayes Estimation,"
Journal of Statistics Applications & Probability: Vol. 7
, Article 6.
Available at: https://dc.naturalspublishing.com/jsap/vol7/iss3/6